Ceramic
      L10.7
      LPBJ
      LPU455B
      LPZ455JL
      LTE
      LTM450U
      LTM450W
      LTM455U
      LTM455W
      LZU450C
      LZU450C4N
      XT
      ECS-96SMF
      MCF 
   SAW
      ECS-D479.5B
      ECS-D480A
      ECS-DSF400.0A-51
      ECS-DSF947.5B-21

Monolithic Crystal MCF
Through Hole Monolithic Crystal Filter IC from ECS International

MCF 10.7MHz to 90MHz, High Stability, Wide Temperature Range, Sharp Cut-off, Low Loss Through Hole Monolithic Crystal Filter IC 

DATA-0081
Product Datasheet for the ECS MCF Through Hole Monolithic Crystal Filter IC

Features

  • 10.7MHz to 90MHz
  • High Stability
  • Wide Temperature Range
  • Sharp Cut-off
  • Low Loss
  • The Monolithic Crystal Filter product range has very high Qs and excellent temperature and aging characteristics.

    These filters offer narrow and intermediate bandwidths and are smaller and more cost effective than a discrete crystal filter.

    With the addition of coupling capacitors between two-pole sections, they can be cascaded to produce four, six, eight or more pole filter responses.


    Support documents for the MCF


    Below is the support information available for the MCF - select a link to download the relevant documentation.

    APNO-0017 - Filter Design Guide
    Design Guide for the ECS range of Filters
    Dated : 10 November 2005 ( Uploaded )
    Relevant to : ECS International - Semiconductors - Filter

    APNO-0018 - Oscillator Circuit Design
    Oscillator Design Considerations for the ECS range of Semiconductors
    Dated : 10 November 2005 ( Uploaded )
    Relevant to : ECS International - Semiconductors

    DATA-0081 - Product Datasheet
    Product Datasheet for the ECS MCF Through Hole Monolithic Crystal Filter IC
    Dated : 22 December 2005 ( Uploaded )
    Relevant to : MCF

    MISC-0020 - Product Selection Matrix
    Product selection matrix for the ECS Filter product range
    Dated : 28 November 2005 ( Uploaded )
    Relevant to : ECS International - Semiconductors - Filter

    MISC-0010 - Reliability Test Procedures
    Reliability Test Procedures for the ECS range of Semiconductors
    Dated : 28 November 2005 ( Uploaded )
    Relevant to : ECS International - Semiconductors


    News information for the MCF


    Below is the news information available for the MCF - select a link to view the relevant information.

    Sorry, no news information is available for this product.