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LPU455B

Home > Products > Semiconductors > ECS > Filter > Ceramic > LPU455B

LPU455B
Through Hole Ceramic Filter IC
 

LPU455B 450KHz to 470KHz, 7.5mm x 9mm, Low Insertion Loss, Excellent Matching Characteristics for IFT Through Hole Ceramic Filter IC 

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ECS International
Semiconductors
Filter
Ceramic

DATA-0073 Product Datasheet for the ECS LPU455B / LPZ455JL Through Hole Ceramic Filter IC

 

DATA-0073
Product Datasheet for the ECS LPU455B / LPZ455JL Through Hole Ceramic Filter IC

 
Features

  • 450KHz to 470KHz
  • 7.5mm x 9mm
  • Low Insertion Loss
  • Excellent Matching Characteristics for IFT
  • The LPU455B product range are ceramic filters ideal for use in AM applications.



    Relevant Support for the LPU455B


    Below is the support information available for the LPU455B - select a link to download the relevant documentation.

    APNO-0017 Design Guide for the ECS range of Filters

    APNO-0017 - Filter Design Guide
    Design Guide for the ECS range of Filters

    Dated : 10 November 2005 ( Uploaded )
    Relevant to : ECS International - Semiconductors - Filter

    APNO-0018 Oscillator Design Considerations for the ECS range of Semiconductors

    APNO-0018 - Oscillator Circuit Design
    Oscillator Design Considerations for the ECS range of Semiconductors

    Dated : 10 November 2005 ( Uploaded )
    Relevant to : ECS International - Semiconductors

    DATA-0073 Product Datasheet for the ECS LPU455B / LPZ455JL Through Hole Ceramic Filter IC

    DATA-0073 - Product Datasheet
    Product Datasheet for the ECS LPU455B / LPZ455JL Through Hole Ceramic Filter IC

    Dated : 22 December 2005 ( Uploaded )
    Relevant to : LPU455B / LPZ455JL

    MISC-0020 Product selection matrix for the ECS Filter product range

    MISC-0020 - Product Selection Matrix
    Product selection matrix for the ECS Filter product range

    Dated : 28 November 2005 ( Uploaded )
    Relevant to : ECS International - Semiconductors - Filter

    MISC-0010 Reliability Test Procedures for the ECS range of Semiconductors

    MISC-0010 - Reliability Test Procedures
    Reliability Test Procedures for the ECS range of Semiconductors

    Dated : 28 November 2005 ( Uploaded )
    Relevant to : ECS International - Semiconductors

    Relevant News for the LPU455B


    Below is the news information available for the LPU455B - select a link to view the relevant information.

    Sorry, no news information is available for this product.

     
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    www.presto.co.uk/lpu455b.cfm ( website updated 02 Jun 2010  ) ©2005 Presto
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