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ECS-DR1

Home > Products > Semiconductors > ECS > Resonator > SAW > ECS-DR1

ECS-DR1
Through Hole SAW Resonator IC
 

ECS-DR1 318MHz, 3.3mm x 9.5mm dia, Quartz Stability Through Hole SAW Resonator IC 

Supplier :
Type :
Sector :
Function :

 

 

ECS International
Semiconductors
Resonator
SAW

DATA-0091 Product Datasheet for the ECS ECS-DR1 Through Hole SAW Resonator IC

 

DATA-0091
Product Datasheet for the ECS ECS-DR1 Through Hole SAW Resonator IC

 
Features

  • 318MHz
  • 3.3mm x 9.5mm dia
  • Quartz Stability
  • The ECS-DR1 is a 1-port surface acoustic wave resonator in a TO39-3A package.

    It offers a fundamental mode quartz frequency and is ideal for remote control and wireless security transmitter applications.

    Relevant Support for the ECS-DR1


    Below is the support information available for the ECS-DR1 - select a link to download the relevant documentation.

    APNO-0016 Design Guide for the ECS range of Resonators

    APNO-0016 - Ceramic Resonator Design Guide
    Design Guide for the ECS range of Resonators

    Dated : 10 November 2005 ( Uploaded )
    Relevant to : ECS International - Semiconductors - Resonator

    APNO-0018 Oscillator Design Considerations for the ECS range of Semiconductors

    APNO-0018 - Oscillator Circuit Design
    Oscillator Design Considerations for the ECS range of Semiconductors

    Dated : 10 November 2005 ( Uploaded )
    Relevant to : ECS International - Semiconductors

    DATA-0091 Product Datasheet for the ECS ECS-DR1 Through Hole SAW Resonator IC

    DATA-0091 - Product Datasheet
    Product Datasheet for the ECS ECS-DR1 Through Hole SAW Resonator IC

    Dated : 22 December 2005 ( Uploaded )
    Relevant to : ECS-DR1

    MISC-0021 Product selection matrix for the ECS Resonator product range

    MISC-0021 - Product Selection Matrix
    Product selection matrix for the ECS Resonator product range

    Dated : 28 November 2005 ( Uploaded )
    Relevant to : ECS International - Semiconductors - Resonator

    MISC-0010 Reliability Test Procedures for the ECS range of Semiconductors

    MISC-0010 - Reliability Test Procedures
    Reliability Test Procedures for the ECS range of Semiconductors

    Dated : 28 November 2005 ( Uploaded )
    Relevant to : ECS International - Semiconductors

    Relevant News for the ECS-DR1


    Below is the news information available for the ECS-DR1 - select a link to view the relevant information.

    Sorry, no news information is available for this product.

     
    Printable version
     
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    www.presto.co.uk/ecs-dr1.cfm ( website updated 02 Jun 2010  ) ©2005 Presto
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