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ECS-D479.5B

Home > Products > Semiconductors > ECS > Filter > SAW > ECS-D479.5B

ECS-D479.5B
Through Hole SAW Filter IC
 

ECS-D479.5B 479.5MHz, 3.5mm x 9.5mm dia, Quartz Stability Through Hole SAW Filter IC 

Supplier :
Type :
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ECS International
Semiconductors
Filter
SAW

DATA-0082 Product Datasheet for the ECS ECS-D479.5B / ECS-D480A Through Hole SAW Filter IC

 

DATA-0082
Product Datasheet for the ECS ECS-D479.5B / ECS-D480A Through Hole SAW Filter IC

 
Features

  • 479.5MHz
  • 3.5mm x 9.5mm dia
  • Quartz Stability
  • The ECS-D479.5B is a 1-port surface acoustic wave resonator in a TO39-3A package.

    It offers a fundamental mode quartz frequency and is ideal for remote control and wireless security transmitter applications.

    Relevant Support for the ECS-D479.5B


    Below is the support information available for the ECS-D479.5B - select a link to download the relevant documentation.

    APNO-0017 Design Guide for the ECS range of Filters

    APNO-0017 - Filter Design Guide
    Design Guide for the ECS range of Filters

    Dated : 10 November 2005 ( Uploaded )
    Relevant to : ECS International - Semiconductors - Filter

    APNO-0018 Oscillator Design Considerations for the ECS range of Semiconductors

    APNO-0018 - Oscillator Circuit Design
    Oscillator Design Considerations for the ECS range of Semiconductors

    Dated : 10 November 2005 ( Uploaded )
    Relevant to : ECS International - Semiconductors

    DATA-0082 Product Datasheet for the ECS ECS-D479.5B / ECS-D480A Through Hole SAW Filter IC

    DATA-0082 - Product Datasheet
    Product Datasheet for the ECS ECS-D479.5B / ECS-D480A Through Hole SAW Filter IC

    Dated : 22 December 2005 ( Uploaded )
    Relevant to : ECS-D479.5B / ECS-D480A

    MISC-0020 Product selection matrix for the ECS Filter product range

    MISC-0020 - Product Selection Matrix
    Product selection matrix for the ECS Filter product range

    Dated : 28 November 2005 ( Uploaded )
    Relevant to : ECS International - Semiconductors - Filter

    MISC-0010 Reliability Test Procedures for the ECS range of Semiconductors

    MISC-0010 - Reliability Test Procedures
    Reliability Test Procedures for the ECS range of Semiconductors

    Dated : 28 November 2005 ( Uploaded )
    Relevant to : ECS International - Semiconductors

    Relevant News for the ECS-D479.5B


    Below is the news information available for the ECS-D479.5B - select a link to view the relevant information.

    Sorry, no news information is available for this product.

     
    Printable version
     
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    www.presto.co.uk/ecs-d479.5b.cfm ( website updated 02 Jun 2010  ) ©2005 Presto
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